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Multiprobe "C" : Compact UHV System
Multiprobe "S" : Basic UHV System
Multiprobe "P", "XP", "RM" : Extensive UHV System with Prep. Chamber
Multiprobe "MXPS" : Monochromated XPS in combination with UHV SPM
Multiprobe "HREELS" : IB 500 HREELS + Multiprobe System
Multiscan LAB
Multiprobe MBE : MBE + Multiprobe System
SPM Probe : UHV System for SPM
Multiprobe ARUPS : UHV system for Angular Resolved Analysis
Cryogenic SFM : Low Temperature SFM
 
 
SCALA
UHV VT Beam Deflection AFM
UHV Variable Temperature AFM/STM
Micro STM
Micro SPM
UHV STM/SEM Stage
UHV Low Temperature STM
Twin SNOM
Cryogenic SFM Head
CryoSXM
UHV AFM/STM
Large Sample SPM
UHV 4-Probe
Micro Piezo Slide
 
 
IB 500 HREEL
AR 65
FOCUS SPLEED
CAS 300 with FOCUS SPLEED
X-ray Sources (DAR 400 Series)
Electron Guns (EKF 300/1000)
Ion Guns (ISE 100/200)
HIS 13VUV Source
Various LEED/AES
XM 500/1000 Mono
EA 125 with FOCUS SPLEED
EA 125 / EA 125 HR Series Hemispherical Energy Analysis
SHA 50 RD with FOCUS SPLEED
Cylinderical Mirror Analyzers (SPLEED)
Photoemission Electron Microscope (PEEM)
ESCA PROBE, Complete ESCA System
 
 
Triple EFM
ISE 10
EFM 3 and EFM 4
Molecular Beam Epitaxy (MBE)
ISE 5